@inproceedings{alvesNATW10,
 author = {N. Imbriglia, N. Alves, J. Dworak},
 title = {Dynamic Test Set Selection using Implication-Based On-Chip Diagnosis},
 booktitle = {17th IEEE North Atlantic Test Workshop},
 month= {May 12-14},
 year = {2010},
 organization={IEEE},
 editor ={},
 isbn = {},
 pages = {},
 publisher = {},
 address = {}
 }