Data Acquisition and Processing - Spring 2012 [website]
Electrical Engineering I - Fall 2011
VHDL: Simulation and Synthesis - Fall 2011 [website]
Brown University
Physical World / Computer Interaction - Fall 2010 [website]
Publications
Trade and Hobbyist Magazines:
N. Alves, Choose your own destination: An entertainment system for the daily commuter, Nuts and Volts, December 2012
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N. Alves, Cracking PDF-File Passwords with a BeagleBone Board, Nuts and Volts, June 2012
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N. Alves, State of the art techniques for detecting transient errors in electrical circuits, IEEE Potentials, Vol. 30, No. 3, May-June 2011
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Journals:
J. Dworak, K. Nepal, N. Alves, Y. Shi, N. Imbriglia, I. Bahar, Using implications to choose tests through suspect fault identification,
ACM Transactions on Design Automation of Electronic Systems, Vol. 18, No. 1, January 2013 [pdf][bibtex][doi]
N. Alves, A. Buben, K. Nepal, R. Iris Bahar, J. Dworak, A Cost Effective Approach For Online Error Detection Using Invariant Relationships, IEEE Transactions on computer-aided design of Integrated Circuits and Systems, Vol. 29, No. 5, May 2010 [pdf][bibtex][doi]
Refereed conferences:
N. Alves, Y. Shi, N. Imbriglia, K. Nepal, R. Iris Bahar, J. Dworak, Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis, 2011 European Test Symposium (ETS), May 23-27, 2011 [summary][ppt][bibtex][website][doi]
N. Alves, Y. Shi, K. Nepal, R. Iris Bahar, J. Dworak, Enhancing Online Error Detection through Area-Efficient Multi-Site Implications, 2011 VLSI Test Symposium (VTS), May 1-5, 2011 [pdf][ppt][bibtex][website][doi]
N. Alves, K. Nepal, R. Iris Bahar, J. Dworak, Improving the Testability and Reliability of Sequential Circuits with Invariant Logic, Great Lakes Symposium on VLSI (GLSVLSI), May 16-18, 2010 [pdf][poster][bibtex][doi]
N. Alves, K. Nepal, R. Iris Bahar, J. Dworak, Compacting Test Vector Sets via Strategic Use of Implications, 2009 International Conference on Computer Aided Design (ICCAD), November 2009 [pdf][ppt][bibtex][doi]
N. Alves, K. Nepal, R. Iris Bahar, J. Dworak, Detecting Errors using Multi-cycle Invariance Information, European Conference of Design Automation and Test (DATE), April 20-24, 2009 [pdf][ppt][bibtex][doi]
K. Nepal, N. Alves, R. Iris Bahar, J. Dworak, Using Implications for Online Error Detection, International Test Conference (ITC), October 28-30, 2008 [pdf][ppt][bibtex][doi]
N. Alves, W. Miranda, F. Fernandes, F. Santana, R. Hohlfeld, N. Cohen, Fractal Element Antenna Genetic Optimization Using a Beowulf PC Cluster, Applied Computational Electromagnetics (ACES), March 2002 [pdf][ppt][bibtex][doi]
Refereed Workshops:
N. Imbriglia, N. Alves, J. Dworak, Dynamic Test Set Selection using Implication-Based On-Chip Diagnosis, 19th North Atlantic Test Workshop (NATW), May 12-14 2010 [pdf][ppt][bibtex][website]
K. Nepal, N. Alves, R. Iris Bahar, J. Dworak, Compacting Test Vector Sets via Strategic Use of Implications, 18th International Workshop on Logic & Synthesis (IWLS), July 2009 [ppt][bibtex][website]
N. Alves, K. Nepal, R. Iris Bahar, J. Dworak, Using Implications for Online Error Detection, 17th IEEE North Atlantic Test Workshop (NATW), May 2008 [ppt][bibtex][website]
N. Alves, K. Nepal, J. Dworak, R. I. Bahar, Detecting Multi-cycle Errors using Invariance Information, 13th IEEE European Test Symposium (ETS), May 25-29, 2008 [ppt][bibtex][website]
Non-refereed contributions / working papers:
N. Alves, Improving the Reliability and Testability of an Integrated Circuit with Logic Implications, May 2011
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N. Alves, Implementing Genetic Algorithms on Arduino Micro-Controllers, February 2010
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N. Alves, Detecting Errors in Reversible Circuits With Invariant Relationships, December 2008
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